High-resolution-electron-microscopy investigation of nanosize inclusions

MRS Bulletin

Volumn 22, Issue 8, 1997, Pages 49-52

  Dahmen, U ^a   Johnson, E ^a   Xiao, S Q ^a   Johansen, A ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; CRYSTAL LATTICES; ELECTRON MICROSCOPY; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; INCLUSIONS; LEAD;

EQUILIBRIUM SHAPE; RESIDUAL STRAIN ENERGY; SOLID ALUMINUM MATRIX;

NANOSTRUCTURED MATERIALS;

EID: 0031212916     PISSN: 08837694     EISSN: None     Source Type: Journal    
DOI: 10.1557/S0883769400033819     Document Type: Article

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