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Volumn 44, Issue 5, 1997, Pages 401-418

Minimum cost component test plans for evaluating reliability of a highly reliable parallel system

Author keywords

[No Author keywords available]

Indexed keywords

DECISION THEORY; MATHEMATICAL PROGRAMMING; PROBLEM SOLVING; RELIABILITY;

EID: 0031212765     PISSN: 0894069X     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1520-6750(199708)44:5<401::AID-NAV1>3.0.CO;2-8     Document Type: Article
Times cited : (15)

References (17)
  • 1
    • 44049112398 scopus 로고
    • The Design of Optimum Component Test Plans in the Demonstration of a Series System Reliability
    • Altinel, K.I., "The Design of Optimum Component Test Plans in the Demonstration of a Series System Reliability," Computational Statistics and Data Analysis, 14, 281-292 (1992).
    • (1992) Computational Statistics and Data Analysis , vol.14 , pp. 281-292
    • Altinel, K.I.1
  • 3
    • 5244382963 scopus 로고
    • On the Application of Component Test Plans to Demonstrate System Reliability
    • Department of Industrial Engineering, University of Pittsburgh, Pittsburgh, PA
    • Coit, D., Rajgopal, J., and Mazumdar, M., "On the Application of Component Test Plans to Demonstrate System Reliability," Technical Report No. 93-7, Department of Industrial Engineering, University of Pittsburgh, Pittsburgh, PA, 1993.
    • (1993) Technical Report No. 93-7
    • Coit, D.1    Rajgopal, J.2    Mazumdar, M.3
  • 4
    • 0000004462 scopus 로고
    • System Based Component Test Plans and Operating Characteristics: Binomial Data
    • Easterling, R.G., Mazumdar, M., Spencer, F.W., and Diegert, K.V., "System Based Component Test Plans and Operating Characteristics: Binomial Data," Technometrics, 33, 287-298 (1991).
    • (1991) Technometrics , vol.33 , pp. 287-298
    • Easterling, R.G.1    Mazumdar, M.2    Spencer, F.W.3    Diegert, K.V.4
  • 5
    • 0016125973 scopus 로고
    • Optimal Test Design for Reliability Demonstration
    • Gal, S., "Optimal Test Design for Reliability Demonstration," Operations Research, 22, 1236-1242 (1974).
    • (1974) Operations Research , vol.22 , pp. 1236-1242
    • Gal, S.1
  • 8
    • 0017634030 scopus 로고
    • An Optimum Procedure for Component Testing in the Demonstration of Series System Reliability
    • Mazumdar, M., "An Optimum Procedure for Component Testing in the Demonstration of Series System Reliability," IEEE Transactions on Reliability, R-26, 342-345 (1977).
    • (1977) IEEE Transactions on Reliability , vol.R-26 , pp. 342-345
    • Mazumdar, M.1
  • 10
    • 0024088663 scopus 로고
    • A Type-II Censored, Log Test-Time Based Component Testing Procedure for a Parallel System
    • Rajgopal, J., and Mazumdar, M., "A Type-II Censored, Log Test-Time Based Component Testing Procedure for a Parallel System," IEEE Transactions on Reliability, 37, 406-412 (1988).
    • (1988) IEEE Transactions on Reliability , vol.37 , pp. 406-412
    • Rajgopal, J.1    Mazumdar, M.2
  • 12
    • 0000360155 scopus 로고
    • Designing Component Test Plans for Series System Reliability via Mathematical Programming
    • Rajgopal, J., and Mazumdar, M., "Designing Component Test Plans for Series System Reliability via Mathematical Programming," Technometrics, 37, 195-212 (1995).
    • (1995) Technometrics , vol.37 , pp. 195-212
    • Rajgopal, J.1    Mazumdar, M.2
  • 14
    • 0022790293 scopus 로고
    • A Comparison of Several Component Testing Plans for a Series System
    • Yan, J.H., and Mazumdar, M., "A Comparison of Several Component Testing Plans for a Series System," IEEE Transactions on Reliability, R-35, 437-443 (1986).
    • (1986) IEEE Transactions on Reliability , vol.R-35 , pp. 437-443
    • Yan, J.H.1    Mazumdar, M.2
  • 15
    • 0001282220 scopus 로고
    • A Comparison of Several Component Testing Plans for a Parallel System
    • Yan, J.H., and Mazumdar, M., "A Comparison of Several Component Testing Plans for a Parallel System," IEEE Transactions on Reliability, R-36, 419-424 (1987).
    • (1987) IEEE Transactions on Reliability , vol.R-36 , pp. 419-424
    • Yan, J.H.1    Mazumdar, M.2
  • 16
    • 0009472686 scopus 로고
    • A Component Testing Plan for a Parallel System with Type II Censoring
    • Yan, J.H., and Mazumdar, M., "A Component Testing Plan for a Parallel System with Type II Censoring," IEEE Transactions on Reliability, R-36, 425-428 (1987).
    • (1987) IEEE Transactions on Reliability , vol.R-36 , pp. 425-428
    • Yan, J.H.1    Mazumdar, M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.