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Volumn 12, Issue 8, 1997, Pages 1038-1045

Simulation of the early stages of thin SiO2 film growth

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CURVE FITTING; DIFFUSION IN SOLIDS; FILM GROWTH; OXIDATION; PRESSURE EFFECTS; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR GROWTH; SILICA; THERMAL EFFECTS; THIN FILMS;

EID: 0031212217     PISSN: 02681242     EISSN: None     Source Type: Journal    
DOI: 10.1088/0268-1242/12/8/018     Document Type: Article
Times cited : (14)

References (13)
  • 7
    • 0003586464 scopus 로고
    • New York: Plenum
    • Feder J 1988 Fractals (New York: Plenum)
    • (1988) Fractals
    • Feder, J.1
  • 10
    • 5544242612 scopus 로고
    • PhD Thesis Yale University
    • Anderson W R 1993 PhD Thesis Yale University
    • (1993)
    • Anderson, W.R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.