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Volumn 395, Issue 1, 1997, Pages 76-80

Optical deep-level transient characterisation of gamma-irradiated semi-insulating gallium arsenide

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTANCE SPECTROSCOPY;

EID: 0031211872     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(97)00617-7     Document Type: Article
Times cited : (2)

References (31)
  • 18
    • 0042656544 scopus 로고
    • Defects in semiconductors
    • H.J. von Bardleben, (Ed.), Aedemansdorf, Switzerland
    • J. Bittebierre, R.T. Cox, E. Molva, in: H.J. von Bardleben, (Ed.), Defects in Semiconductors, Tans. Tech. Publ., Aedemansdorf, Switzerland, 1986, p. 365.
    • (1986) Tans. Tech. Publ. , pp. 365
    • Bittebierre, J.1    Cox, R.T.2    Molva, E.3
  • 19
    • 0042656542 scopus 로고
    • Defects in semiconductors
    • G. Ferenczi (Ed.), Aedemansdorf, Switzerland
    • J. Bittebierre, R.T. Cox, R. Picard, E. Molva, in: G. Ferenczi (Ed.), Defects in Semiconductors, Trans. Tech. Publ., Aedemansdorf, Switzerland, 1989, p. 107.
    • (1989) Trans. Tech. Publ. , pp. 107
    • Bittebierre, J.1    Cox, R.T.2    Picard, R.3    Molva, E.4
  • 27
    • 30244519301 scopus 로고    scopus 로고
    • private communication.
    • C. Schwab, private communication.
    • Schwab, C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.