Study of microstructure and interfacial interaction of Al-C60 Co-evaporated films

Physica C: Superconductivity and its Applications

Volumn 282-287, Issue PART 2, 1997, Pages 737-738

  Li, Yongqing ^a   Wang, Yan ^a   Xu, Wentao ^a   Hou, J G ^a   Zhang, Y H ^a  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; CHEMICAL BONDS; CRYSTAL MICROSTRUCTURE; EVAPORATION; FULLERENES; INTERFACES (MATERIALS); RAMAN SPECTROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

COEVAPORATION;

SUPERCONDUCTING FILMS;

EID: 0031211544     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0921-4534(97)00555-8     Document Type: Article

References (4)

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3. A.J. Maxwell et al. Phys. Rev. B52, R5546(19954.
4. S.J. Dulcos et al., Science 254, 1625(1991)