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Volumn 234-236, Issue , 1997, Pages 347-350

Simulation of electron microscope dislocation images in cubic and non-cubic structures

Author keywords

Dislocation contrast; Elastic anisotropy; Thickness contours

Indexed keywords

ANISOTROPY; APPROXIMATION THEORY; COMPUTER SIMULATION; CRYSTAL DEFECTS; ELASTICITY; IMAGE ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY; VECTORS;

EID: 0031211454     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0921-5093(97)00177-9     Document Type: Article
Times cited : (2)

References (11)
  • 1
    • 0003904573 scopus 로고
    • Computed electron micrographs and defect identification
    • S. Amelinckx, R. Gevers, J. Nihoul (Eds.), North-Holland, Amsterdam
    • A.K. Head, P. Humble, L.M. Clarebrough, A.J. Morton, C.T. Forwood, Computed Electron Micrographs and Defect Identification, in: S. Amelinckx, R. Gevers, J. Nihoul (Eds.), Defects in Crystalline Solids 7, North-Holland, Amsterdam, 1973.
    • (1973) Defects in Crystalline Solids , vol.7
    • Head, A.K.1    Humble, P.2    Clarebrough, L.M.3    Morton, A.J.4    Forwood, C.T.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.