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Volumn 115, Issue 4, 1997, Pages 381-385
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Rutherford backscattering and channeling studies of a TiO 2 (100) substrate, epitaxially grown pure and Nb-doped TiO 2 films
a b b a a |
Author keywords
[No Author keywords available]
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Indexed keywords
ATOMS;
CALCULATIONS;
NIOBIUM;
RUTHERFORD BACKSCATTERING SPECTROSCOPY;
SURFACE PROPERTIES;
SURFACES;
TITANIUM DIOXIDE;
CHANNELING TECHNIQUE;
SURFACE SEGREGATION;
FILM GROWTH;
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EID: 0031211002
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/S0169-4332(97)00005-6 Document Type: Article |
Times cited : (15)
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References (16)
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