Scanning tunneling spectroscopy of indium tin oxide film in air

Applied Surface Science

Volumn 115, Issue 4, 1997, Pages 399-401

  Kasiviswanathan, S ^a   Srinivas, V ^a   Kar, A K ^a   Mathur, B K ^a   Chopra, K L ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY   (India)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON BEAMS; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING INDIUM COMPOUNDS; SILICON WAFERS; SPECTROSCOPY;

INDIUM TIN OXIDE; SCANNING TUNNELING SPECTROSCOPY;

THIN FILMS;

EID: 0031210569     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(97)00117-7     Document Type: Article

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