Order in thin films of side-chain liquid-crystalline polymers

Langmuir

Volumn 13, Issue 17, 1997, Pages 4762-4766

  Van Der Wielen, M W J ^a   Cohen Stuart, M A ^a   Fleer, G J ^a   De Boer, D K G ^b   Leenaers, A J G ^b   Nieuwhof, R P ^a   Marcelis, A T M ^a   Sudholter E J R ^a  

^a WAGENINGEN UNIVERSITY   (Netherlands)

^b PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; ELECTRONIC DENSITY OF STATES; GLASS TRANSITION; INTERFACIAL ENERGY; SURFACE ROUGHNESS; SURFACE STRUCTURE; TEMPERATURE; THIN FILMS;

INTERFACIAL ROUGHNESS; SIDE CHAIN LIQUID CRYSTALLINE POLYMERS; SURFACE TOPOGRAPHY; X RAY REFLECTOMETRY;

LIQUID CRYSTAL POLYMERS;

EID: 0031210311     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la970243d     Document Type: Article

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