Structural characterization of Fe3O4-NiO Superlattices Using High-reSolution Transmission Electron Microscopy

Journal of Materials Research

Volumn 12, Issue 8, 1997, Pages 2143-2151

  Recnik A ^a,b   Carroll, D L ^a   Shaw, K A ^c   Lind, D M ^c   Ruhle M ^a  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

^b JO EF STEFAN INSTITUTE   (Slovenia)

^c Florida State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ORIENTATION; INTERFACES (MATERIALS); IRON OXIDES; MAGNESIA; MOLECULAR BEAM EPITAXY; NICKEL COMPOUNDS; PLASMA APPLICATIONS; STRAIN; SUBSTRATES; TRANSMISSION ELECTRON MICROSCOPY;

NICKEL OXIDES;

SUPERLATTICES;

EID: 0031210279     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/jmr.1997.0287     Document Type: Article

References (22)

1. P. D. Battle, T. C. Gibb, and S. Nixon, J. Solid State Chem. 77, 124 (1988).
2. F. N. Mott. Adv. Phys. 39, 55 (1990).
3. C. Zener, Phys. Rev. 81, 440 (1951).
4. P. A. Cox, in Transition Metal Oxides: An Introduction 10 Their Electronic Structure and Properties (Oxford University Press, Oxford, England, 1995), pp. 148, 149.
5. J. Kondo, Solid State Phys. 23, 184 (1969).
6. S. D. Berry, D. M. Lind, G. Chern, and H. Mathias, J. Magn. & Magn. Mater. 123, 126 (1993).
7. Z. Kakol, R. N. Pribble, and J. M. Honig, Solid State Commun. 69, 793 (1989).
8. R. S. Tebble and D. J. Craik, in Magnetic Materials (John Wiley, London, England, 1969).
9. D. M. Lind, S. D. Berry, G. Chern, Mathias, and L. R. Testardi, Phys. Rev. B 45, 1838 (1992).
10. F. S. Galasso, Structure and Properties of Inorganic Solids (Pergamon Press, Oxford, England, 1970), pp. 59, 217.
11. Powder Diffraction File: Inorganic Phases, edited by W. F. McClung (International Center for Diffraction Data, Swarthmore, PA, 1990).
12. T. Fujii, M. Takano, R. Katano, Y. Bando, and Y. Isozumi, J. Cryst. Growth 99, 606 (1990).
13. C. Ortiz, G. Lim, M. M. Chen, and G. Castillo, J. Mater. Res. 3, 344 (1988).
14. S. Yoshii, O. Ishii, S. Hattori, T. Nakagawa, and J. Ishida, J. Appl. Phys. 53, 2556 (1982).
15. D. M. Lind, S-P. Tay, S. D. Berry, J. A. Borchers, and R. W. Erwin, J. Appl. Phys. 73, 6886 (1993).
16. R. M. Wolf, A. E. M. De Veirman, P. van der Sluis, P. J. van der Zaag and J. B. F. van der Stegge, in Epitaxial Oxide Thin Films and Heterostructures, edited by D. K. Fork, J. M. Phillips, R. Ramesh, and R. M. Wolf (Mater. Res. Soc. Symp. Proc. 341, Pittsburgh, PA, 1994), p. 23.
17. A. Strecker, U. Salzberger, and J. Mayer, Praktische Metallographie 30, 481 (1993).
18. P. A. Stadelmann, Ultramicroscopy 21, 131 (1987).
19. G. Möbus, G. Necker, and M. Rühle, Ultramicroscopy 46, 46 (1993).
20. J. A. Borchers, R. W. Erwin, S. D. Berry, D. M. Lind, E. Lochner, and K. A. Shaw, Appl. Phys. Lett. 64, 381 (1994).
21. J. A. Borchers, R. W. Erwin, S. D. Berry, D. M. Lind, J. Anker, E. Lochner, K. A. Shaw, and D. Hilton, J. Appl. Phys. 51, 8276 (1995).
22. A. Rečnik and D. Kolar, Acta Chim. Slov. 42, 219 (1995).