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Volumn 36, Issue 8, 1997, Pages 5356-5360
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Simulation of monolithic silicon LLL scanning X-ray interferometer
a,c
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Author keywords
Avogadro constant; Lattice plane spacing; Nanotechnology; X ray interferometer
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Indexed keywords
AVOGADRO'S CONSTANT;
LATTICE PLANE SPACING;
X RAY INTERFEROMETERS;
CRYSTAL LATTICES;
MATHEMATICAL MODELS;
NANOTECHNOLOGY;
SILICON;
TRANSDUCERS;
INTERFEROMETERS;
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EID: 0031209906
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/jjap.36.5356 Document Type: Article |
Times cited : (1)
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References (16)
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