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Volumn 36, Issue 8, 1997, Pages 5356-5360

Simulation of monolithic silicon LLL scanning X-ray interferometer

Author keywords

Avogadro constant; Lattice plane spacing; Nanotechnology; X ray interferometer

Indexed keywords

AVOGADRO'S CONSTANT; LATTICE PLANE SPACING; X RAY INTERFEROMETERS;

EID: 0031209906     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.36.5356     Document Type: Article
Times cited : (1)

References (16)
  • 1
    • 0002487817 scopus 로고
    • X-ray Optics
    • ed. H. J. Queisser Springer, Berlin
    • U. Bonse and W. Graeff: X-ray Optics, ed. H. J. Queisser (Springer, Berlin, 1977) Topics in Applied Physics, Vol. 33, p. 83.
    • (1977) Topics in Applied Physics , vol.33 , pp. 83
    • Bonse, U.1    Graeff, W.2
  • 12
    • 3342965141 scopus 로고    scopus 로고
    • distributed by Solvia Eng. AB, Våsterås, Sweden
    • Solvia System 92.0, distributed by Solvia Eng. AB, Våsterås, Sweden.
    • Solvia System 92.0


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.