Electrical breakdown of small gaps in vacuum

IEEE Transactions on Dielectrics and Electrical Insulation

Volumn 4, Issue 4, 1997, Pages 358-364

  Zouache, N ^a   Lefort, A ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC BREAKDOWN OF SOLIDS; ELECTRIC INSULATION; ELECTRODES; ELECTRON MICROSCOPY; HEATING; SILVER ALLOYS; SPECTROSCOPIC ANALYSIS; VACUUM;

ENERGY DISPERSING SPECTROSCOPY; SECONDARY ELECTRON MICROSCOPY;

ELECTRIC ARCS;

EID: 0031209767     PISSN: 10709878     EISSN: None     Source Type: Journal    
DOI: 10.1109/94.625348     Document Type: Article

References (12)

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3. W. S. Boyle, P. Kisliuk, and L. H. Germer, "Electrical Breakdown in High Vacuum", J. Appl. Phys., Vol. 6, pp. 720-725, 1955.
4. N. V. Tatarinova and Yu. V. Grigoriev, "Total Voltage Effect and Electrode Porosity", XVI Int Symp on Discharge and Electrical Insulation in Vacuum. Moscow-Russia, Vol. 49, pp. 49-52, 1994.
5. H. Craig Miller, "Change in Field Intensification Factor Beta of an Electrode Projection (Whisker) at Short Gap Lengths", J. Appl. Phys., Vol. 38, pp. 4501-4504, 1967.
6. M. Khalifa, "Properties of Vacuum as a Switching Ambient", Canad. J. Tech., Vol. 34, pp. 304-315, 1956.
7. I. N. Slivkov, "The Influence of The Electrode Temperature on the Electrical Breakdown Strength of a Vacuum Gap", Soviet Physics-Technical Physics, Vol. 2, pp. 707-709, 1958.
8. A. Septier, F. Sabary, J. C. Dudek, and A. Boumiz, "An Alkali Dispenser Photocathode (Al-Li)-Ag-O-Li", C. R. Acad. Sci. Paris, t. 314, serie. II, pp. 569-574, 1992.
9. P. Ravari, Etude de la formation d'un arc dans le vide par l'analyse des temps de commutation, Thèse de 3ème cycle à l'Université de Paris sud, No d'ordre 107, 1971.
10. M. Gollor, "Time Characteristics of the Vacuum Breakdown Under Impulse Stress", ETEP, Vol. 1, No 3, pp. 137-142, 1991.
11. H. Craig Miller, "Vacuum Arc Anode Phenomena", IEEE Transactions on Plasma Science, Vol. 11, No 2, pp. 76-89, 1983.
12. C. W. Kimblin, "Vacuum Arc Ion Currents and Electrode Phenomena", Proc. IEEE, Vol. 59, pp. 546-555, 1971.