Dechanneling in single-crystals due to in-flight secondary decay: A method for measuring short nuclear lifetimes

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 129, Issue 3, 1997, Pages 341-348

  Malaguti, Franco ^a   Giardina, Giorgio ^b   Olivo, Paola ^c  

^a INFN SEZIONE DI BOLOGNA   (Italy)

^b UNIVERSITY OF MESSINA   (Italy)

^c UNIVERSITY OF BOLOGNA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; INTEGRAL EQUATIONS; ION BEAMS; ION BOMBARDMENT; MATHEMATICAL MODELS; MONTE CARLO METHODS; NONLINEAR EQUATIONS; TARGETS;

DECHANNELING;

SINGLE CRYSTALS;

EID: 0031209588     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(97)00306-6     Document Type: Article

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