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Volumn 395, Issue 1, 1997, Pages 94-97

Traps in GaAs detectors (before and after irradiation) and electric field redistribution in excited SI-GaAs

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; CRYSTAL GROWTH; DISLOCATIONS (CRYSTALS); ELECTRIC CONDUCTIVITY OF SOLIDS; ELECTRIC CURRENT MEASUREMENT; ELECTRIC FIELD EFFECTS; HALL EFFECT; HEAT TREATMENT; MAGNETOOPTICAL EFFECTS; NONLINEAR OPTICS; SEMICONDUCTING GALLIUM ARSENIDE;

EID: 0031209437     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(97)00619-0     Document Type: Article
Times cited : (6)

References (8)
  • 8
    • 0029542549 scopus 로고
    • Photo-diffractive characterisation of growth defects in GaAs
    • S. Ashok et al. (Ed.), Defect and Impurity Engineered Semiconductors and Devices, MRS, Pittsburgh, USA
    • K. Jarasiunas, M. Sudzius, A. Kaniava, J. Vaitkus, Photo-diffractive Characterisation of Growth Defects in GaAs, in: S. Ashok et al. (Ed.), Defect and Impurity Engineered Semiconductors and Devices, Mater. Res. Soc. Symp. Proc. 378, 1995, MRS, Pittsburgh, USA, p. 59.
    • (1995) Mater. Res. Soc. Symp. Proc. , vol.378 , pp. 59
    • Jarasiunas, K.1    Sudzius, M.2    Kaniava, A.3    Vaitkus, J.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.