Using neural networks to solve testing problems

IEEE Aerospace and Electronic Systems Magazine

Volumn 12, Issue 8, 1997, Pages 36-40

  Kirkland, Larry V ^a,c   Wright, R Glenn ^b  

^a OO ALC/TISAC USAF   (United States)

^b GMA Industries Inc   (United States)

^c Air Force Materiel Command   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC EQUIPMENT TESTING; SENSORS;

CIRCUIT FAULTS;

NEURAL NETWORKS;

EID: 0031209196     PISSN: 08858985     EISSN: None     Source Type: Journal    
DOI: 10.1109/62.609531     Document Type: Article

References (6)

1. NeuralWare, 1993, Neural Computing, "What makes Neural Computing Different?"
2. S. Abe, et. al., 1993, "Extracting Algorithms from Pattern Classification Neural Networks," Neural Networks, Vol. 5, No. 6, pp. 729-735.
3. Mary B. Ottaway, Patrice Y. Simard and Dana H. Ballard, 1989, Advances in Neural Information Processing Systems 1, "Fixed Point Analysis for Recurrent Networks," p. 149.
4. K. Funahashi, 1989, "On the Approximate Realization of Continuous Mapping by Neural Networks," Neural Networks, Vol. 2, pp. 183-192.
5. D.L. Chester, 1990, "Why Two Hidden Layers are Better Than One," Proc. of the International Joint Conference on Neural Networks, Washington, DC, Vol. 1, pp. 265-268.
6. Stephen Grossberg, 1988, Neural Networks and Natural Intelligence, "Competitive Learning: From Interactive Activation to Adaptive Resonance," p. 213.