Intrinsic Josephson junctions of Tl2Ba2CaCu2O8 thin films

Physica C: Superconductivity and its Applications

Volumn 282, Issue PART 4, 1997, Pages 2433-2434

  Yan, S L ^a   Fang, L ^a   Si, M S ^a   Wang, J ^a   Hao, J M ^b   Song, Q X ^a  

^a NANKAI UNIVERSITY   (China)

^b Tianjin Electronic Materials Research Institute   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CURRENT VOLTAGE CHARACTERISTICS; EPITAXIAL GROWTH; HIGH TEMPERATURE SUPERCONDUCTORS; LANTHANUM COMPOUNDS; OXIDE SUPERCONDUCTORS; SUBSTRATES; SUPERCONDUCTING FILMS; THALLIUM COMPOUNDS; THERMAL EFFECTS; THIN FILM DEVICES;

INTRINSIC JOSEPHSON JUNCTIONS; THIN FILM MICROBRIDGES;

JOSEPHSON JUNCTION DEVICES;

EID: 0031208826     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(97)01283-5     Document Type: Article

References (4)

1. S.L. Yan, L. Fang, Q.X. Song, and J. Yan, Appl. Phys. Lett. 63 (1993) 1845.
2. R. Kleiner and P. Muller, Physical Review B 49 (1994) 1327; R. Kleiner, P. Muller, H. Kohlstedt, N.F. Pedersen, and S. Sakai, Physical Review B 50 (1994) 3942.
3. R. Kleiner and P. Muller, Physical Review B 49 (1994) 1327; R. Kleiner, P. Muller, H. Kohlstedt, N.F. Pedersen, and S. Sakai, Physical Review B 50 (1994) 3942.
4. F.X. Regi, J. Schneck, J.F. Palmier, and H. Savary, J. Appl. Phys. 76 (1994) 4426.