Electrical verification of the HP PA 8000 processor

Hewlett-Packard Journal

Volumn 48, Issue 4, 1997, Pages 32-39

  Bockhaus, John W ^a   Bhatia, Rohit ^a   Ramsey, C Michael ^a   Butler, Joseph R ^a   Ljung, David J ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER DEBUGGING; COMPUTER SIMULATION; RELIABILITY; ROM; VLSI CIRCUITS;

POSTSILICON ELECTRICAL VERIFICATION; SHMOO PLOTS;

MICROPROCESSOR CHIPS;

EID: 0031208175     PISSN: 00181153     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (0)