메뉴 건너뛰기




Volumn 79, Issue 6, 1997, Pages 1074-1077

Spectroscopic identification of the SiO2 complex in oxygen-implanted GaAs:Si

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRYSTAL DEFECTS; CRYSTAL MICROSTRUCTURE; FOURIER TRANSFORM INFRARED SPECTROSCOPY; MATHEMATICAL MODELS; MOLECULAR BEAM EPITAXY; MOLECULAR VIBRATIONS; SILICA;

EID: 0031208021     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.79.1074     Document Type: Article
Times cited : (2)

References (26)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.