Characterization of solidified gas thin film targets via alpha particle energy loss

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 395, Issue 2, 1997, Pages 159-168

  Fujiwara, M C ^a   Beer, G A ^a,b   Beveridge, J L ^c   Douglas, J L ^b   Huberd, T M ^d   Jacot Guillarmod, R ^e   Kim, S K ^f   Knowles, P E ^b,j   Kunselman, A R ^g   Maier, M ^b   Marshall, G M ^c   Mason, G R ^b   Mulhauser, F ^c,e   Olin, A ^c   Petitjean, C ^h   Porcelli, T A ^b   Zmeskal, J ⁱ  

^a UNIVERSITY OF BRITISH COLUMBIA   (Canada)

^b UNIVERSITY OF VICTORIA   (Canada)

^c TRIUMF   (Canada)

^d GUSTAVUS ADOLPHUS COLLEGE   (United States)

^e UNIVERSITY OF FRIBOURG   (Switzerland)

^f Chonbuk National University   (South Korea)

^g UNIVERSITY OF WYOMING   (United States)

^h PAUL SCHERRER INSTITUTE   (Switzerland)

ⁱ ERICH SCHMID INSTITUTE OF MATERIALS SCIENCE   (Austria)

^j UNIVERSITÉ CATHOLIQUE DE LOUVAIN   (Belgium)

more..

Author keywords

[No Author keywords available]

Indexed keywords

ALPHA PARTICLES; COMPUTER SIMULATION; DEPOSITION; ENERGY DISSIPATION; MONTE CARLO METHODS; THICKNESS MEASUREMENT; THIN FILM DEVICES;

TRIUMF SOLID HYDROGEN TARGET SYSTEM;

TARGETS;

EID: 0031207849     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(97)00716-X     Document Type: Article

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