Atomic ordering in xZrO2·(1-x) SiO2 xerogels (x=0.3, 0.5) by X-ray diffraction and reverse Monte Carlo simulations

Journal of Materials Science

Volumn 32, Issue 16, 1997, Pages 4209-4216

  Stachs, O ^a   Gerber, Th ^a   Petkov, V ^a,b  

^a UNIVERSITY OF ROSTOCK   (Germany)

^b UNIVERSITY OF SOFIA   (Bulgaria)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CRYSTAL ATOMIC STRUCTURE; CRYSTALLINE MATERIALS; CRYSTALLIZATION; HEAT TREATMENT; MONTE CARLO METHODS; PHASE COMPOSITION; SEGREGATION (METALLOGRAPHY); SILICA; THERMAL EFFECTS; X RAY DIFFRACTION ANALYSIS; ZIRCONIA;

ATOMIC DISTRIBUTION FUNCTIONS; XEROGELS;

GELS;

EID: 0031207213     PISSN: 00222461     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1018686831719     Document Type: Article

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