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Volumn 140, Issue 4-6, 1997, Pages 220-225
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Time-frequency modeling of atomic force microscopy
a b |
Author keywords
[No Author keywords available]
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Indexed keywords
MATHEMATICAL MODELS;
MATHEMATICAL TRANSFORMATIONS;
PHASE SPACE METHODS;
ULTRAFAST PHENOMENA;
TEMPORAL FRACTIONAL FOURIER DEVICE;
WIGNER TRANSFORMS;
ATOMIC FORCE MICROSCOPY;
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EID: 0031206624
PISSN: 00304018
EISSN: None
Source Type: Journal
DOI: 10.1016/S0030-4018(97)00176-4 Document Type: Article |
Times cited : (4)
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References (13)
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