Use of multiple-wavelength and/or TE/TM effective-refractive-index measurements to reconstruct refractive-index profiles

IEE Proceedings: Optoelectronics

Volumn 144, Issue 4, 1997, Pages 213-219

  Oven, R ^a   Batchelor, S ^a   Ashworth, D G ^a  

^a UNIVERSITY OF KENT   (United Kingdom)

Author keywords

Optical waveguide; Refractive index

Indexed keywords

ERROR ANALYSIS; FREQUENCY RESPONSE; LIGHT POLARIZATION; MEASUREMENT ERRORS; OPTICAL VARIABLES MEASUREMENT; REFRACTIVE INDEX;

REFRACTIVE INDEX MEASUREMENT;

OPTICAL WAVEGUIDES;

EID: 0031200105     PISSN: 13502433     EISSN: None     Source Type: Journal    
DOI: 10.1049/ip-opt:19971273     Document Type: Article

References (13)

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