Theoretical study of Si Kβ X-ray fluorescence spectrum of SiO2-Na2O binary slag by DV-Xα molecular orbital calculation

Materials Transactions, JIM

Volumn 38, Issue 8, 1997, Pages 724-730

  Morishita, Masao ^a   Koyama, Koichiro ^a   Morinaga, Masahiko ^b   Adachi, Hirohiko ^c  

^a UNIVERSITY OF HYOGO   (Japan)

^b NAGOYA UNIVERSITY   (Japan)

^c KYOTO UNIVERSITY   (Japan)

Author keywords

Basicity; Discrete variational X molecular orbital calculation; Partial density of states dealing with the Na2O content; Si K X ray fluorescence spectrum; SiO2 Na2O binary slag

Indexed keywords

COMPUTATIONAL METHODS; COMPUTER SIMULATION; ELECTRONIC DENSITY OF STATES; FLUORESCENCE; PH; SILICA; SILICON; SODIUM COMPOUNDS; VARIATIONAL TECHNIQUES; X RAY SPECTROSCOPY;

MOLECULAR ORBITALS; SODIUM OXIDE;

SLAGS;

EID: 0031199779     PISSN: 09161821     EISSN: None     Source Type: Journal    
DOI: 10.2320/matertrans1989.38.724     Document Type: Article

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