A systematic approach to the analysis of complex interaction patterns in two-level factorial designs

Technometrics

Volumn 39, Issue 3, 1997, Pages 286-297

  Filliben, James J ^a   Li, Ker Chau ^b  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Data visualization; Dimension reduction; Linear domain analysis; Partition tree; Principal Hessian direction; Residual analysis; Splitting

Indexed keywords

COMPUTER VISION; DATA ACQUISITION; DATA REDUCTION; DATA STRUCTURES; DIGITAL TO ANALOG CONVERSION; ELECTRONIC EQUIPMENT TESTING; MATHEMATICAL MODELS; PRODUCT DESIGN;

DIMENSION REDUCTION; LINEAR DOMAIN ANALYSIS; PARTITION TREE; PRINCIPAL HESSIAN DIRECTION; RESIDUAL ANALYSIS; SPLITTING; TWO LEVEL FACTORIAL DESIGNS;

STATISTICAL METHODS;

EID: 0031199388     PISSN: 00401706     EISSN: 15372723     Source Type: Journal    
DOI: 10.1080/00401706.1997.10485120     Document Type: Article

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