Scales and covers in general measurement problem

IEEE Transactions on Instrumentation and Measurement

Volumn 46, Issue 4, 1997, Pages 961-965

  Muravyov, Sergey V ^a   Savolainen, Vesa ^b  

^a NATIONAL RESEARCH TOMSK POLYTECHNIC UNIVERSITY   (Russian Federation)

^b UNIVERSITY OF JYVÄSKYLÄ   (Finland)

Author keywords

Check; Covers; Diagnostics; Measurement information systems; Measurement problem; Measurement theory; Pattern recognition; Scales

Indexed keywords

OPTIMIZATION; PATTERN RECOGNITION; PROBLEM SOLVING; SET THEORY;

GENERAL MEASUREMENT PROBLEM (GMP); MEASUREMENT INFORMATION SYSTEMS (MIS);

MEASUREMENT THEORY;

EID: 0031199147     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.650808     Document Type: Article

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