Monitoring the calibration status of a measuring instrument by a stochastic model

IEEE Transactions on Instrumentation and Measurement

Volumn 46, Issue 4, 1997, Pages 747-751

  Bobbio, Andrea ^a,b   Tavella, Patrizia ^c   Montefusco, Andrea ^a,d   Costamagna, Stefania ^d  

^a IEEE

^b UNIVERSITY OF TURIN   (Italy)

^c ISTITUTO ELETTROTECNICO NAZIONALE GALILEO FERRARIS   (Italy)

^d MEMC Electronic Materials SpA   (Italy)

Author keywords

Calibration intervals; Measuring instrument; Stochastic models

Indexed keywords

MATHEMATICAL MODELS; OPTIMIZATION; RANDOM PROCESSES;

MEASURING INSTRUMENTS; STOCHASTIC DRIFT MODELS;

CALIBRATION;

EID: 0031197847     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.650766     Document Type: Article

References (6)

1. OIML, "Conseils pour la détermination des intervalles de réétallonage des équipments de mesure utilisés dans les laboratoires d'essais," Organization Int. de Métrologie Légale, Tech. Rep. DI 10, 1984.
2. NCSL, "Establishment and adjustment of calibration intervals," Nat. Conf. Standards Labs., Tech. Rep. RP1, 1989.
3. A. Bobbio and A. Cumani, "A Markov approach to wear-out modeling," Microelectron. Reliab., vol. 23, pp. 113-119, 1983.
4. J. D. Esary, A. W. Marshall, and F. Proschan, "Shock models and wear processes," Ann. Probability, vol. 1, pp. 627-649, 1973.
5. P. Tavella, A. Bobbio, S. Costamagna, and A. Montefusco "Stochastic drift modes for the determination of calibration intervals," in Adv. Math. Tools Metrology III. Singapore: World Scientific, 1996.
6. A. Papoulis, Probability, Random Variables, and Stochastic Processes. New York: McGraw-Hill, 1965.