Two new six-port reflectometers covering very large Bandwidths

IEEE Transactions on Instrumentation and Measurement

Volumn 46, Issue 4, 1997, Pages 966-969

  Hesselbarth, Jan ^a   Wiedmann, Frank ^b   Huyart, Bernard ^c  

^a ETH ZURICH   (Switzerland)

^b Texas Instruments Deutschland GmbH   (Germany)

^c TELECOM PARISTECH   (France)

Author keywords

Calibration procedure; Diode detector linearization; Large bandwidth; Network analysis; Reflection coefficient measurement; Six port reflectometer; Temperature correction

Indexed keywords

BANDWIDTH; CALIBRATION; ELECTRIC NETWORK ANALYSIS; LUMPED PARAMETER NETWORKS; SCHOTTKY BARRIER DIODES; SURFACE MOUNT TECHNOLOGY; TRANSMISSION LINE THEORY;

REFLECTION COEFFICIENT MEASUREMENT; SIX PORT REFLECTOMETERS;

REFLECTOMETERS;

EID: 0031197783     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.650809     Document Type: Article

References (7)

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