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Volumn 1, Issue 1, 1997, Pages 33-47

Grinding-and-slicing technique as an advanced technology for silicon wafer slicing

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC EMISSIONS; COST EFFECTIVENESS; GRINDING (MACHINING); GRINDING MACHINES; MICROELECTRONIC PROCESSING; SAWING; WEAR OF MATERIALS;

EID: 0031197397     PISSN: 10910344     EISSN: None     Source Type: Journal    
DOI: 10.1080/10940349708945636     Document Type: Article
Times cited : (29)

References (15)
  • 1
    • 0026239071 scopus 로고
    • A Future Technology for Silicon Wafer Processing for VLSI
    • T. Abe, "A Future Technology for Silicon Wafer Processing for VLSI " Precision Engineering, 13(4) (1991) 251-255.
    • (1991) Precision Engineering , vol.13 , Issue.4 , pp. 251-255
    • Abe, T.1
  • 3
    • 0026117959 scopus 로고
    • Technical Trends in Large Diameter Silicon Wafers
    • M. Watanabe, "Technical Trends in Large Diameter Silicon Wafers," Solid State Technology, 39(3) (1991) 69-73.
    • (1991) Solid State Technology , vol.39 , Issue.3 , pp. 69-73
    • Watanabe, M.1
  • 4
    • 38849198849 scopus 로고
    • Abrasive Machining of Silicon
    • H. K. Tönshoff et al., "Abrasive Machining of Silicon," Annals of the CIRP, 39(2) (1990) 621-635.
    • (1990) Annals of the CIRP , vol.39 , Issue.2 , pp. 621-635
    • Tönshoff, H.K.1
  • 7
    • 0023168353 scopus 로고
    • ID Cut-Off Grinding of Brittle Materials
    • E. Brinksmeier and W. von Schmieden, "ID Cut-Off Grinding of Brittle Materials," Annals of the CIRP, 36(1) (1987) 219-222.
    • (1987) Annals of the CIRP , vol.36 , Issue.1 , pp. 219-222
    • Brinksmeier, E.1    Von Schmieden, W.2
  • 13
    • 0027990193 scopus 로고
    • Acoustic Emission for Process Control and Monitoring of Surface Integrity during Grinding
    • J. Webster, I. Marinescu, and R. Bennett, "Acoustic Emission for Process Control and Monitoring of Surface Integrity During Grinding," Annals of the CIRP, 43(1) (1994) 295-298.
    • (1994) Annals of the CIRP , vol.43 , Issue.1 , pp. 295-298
    • Webster, J.1    Marinescu, I.2    Bennett, R.3
  • 14
    • 3342962629 scopus 로고
    • Werkzeugaufspannung und Prozeßverlauf beim ID-Trennschleifen
    • E. Brinksmeier and W. von Schmieden, "Werkzeugaufspannung und Prozeßverlauf beim ID-Trennschleifen," Industrie Diamanten Rundschau, 22(4) (1988) 214-219.
    • (1988) Industrie Diamanten Rundschau , vol.22 , Issue.4 , pp. 214-219
    • Brinksmeier, E.1    Von Schmieden, W.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.