A surface EXAFS study of thin nickel deposits on (110) TiO2 surfaces

Thin Solid Films

Volumn 304, Issue 1-2, 1997, Pages 267-272

  Bourgeois, S ^a   Seigneur, P Le ^a   Perdereau, M ^a   Chandesris, D ^b   Fevre P Le ^b   Magnan, H ^c  

^a UNIVERSITÉ DE BOURGOGNE   (France)

^b UNIVERSITÉ PARIS SACLAY   (France)

^c CEA SACLAY   (France)

Author keywords

Growth mechanism; Nickel; Titanium oxide; X ray absorption

Indexed keywords

DEPOSITION; GROWTH (MATERIALS); MONOLAYERS; OXYGEN; TITANIUM DIOXIDE; X RAY ANALYSIS;

EXTENDED X RAY ABSORPTION FINE STRUCTURE (EXAFS);

NICKEL;

EID: 0031193034     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(96)09603-4     Document Type: Article

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