Differential negative resistance and piezoresistivity in thin semiconducting BaTiO3 ceramic bars

Journal of the American Ceramic Society

Volumn 80, Issue 7, 1997, Pages 1881-1884

  Kuwabara, Makoto ^a,c   Matsuda, Hirofumi ^a   Hamamoto, Koichi ^a,b  

^a UNIVERSITY OF TOKYO   (Japan)

^b KYUSHU INSTITUTE OF TECHNOLOGY   (Japan)

^c AMERICAN CERAMIC SOCIETY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CURRENTS; ELECTRIC FIELDS; ELECTRIC RESISTANCE; GRAIN BOUNDARIES; MORPHOLOGY; PIEZOELECTRICITY; SEMICONDUCTOR MATERIALS; STRESSES;

BENDING STRESS; CURIE POINT; DIFFERENTIAL NEGATIVE RESISTANCE; FERROELECTRIC DOMAIN STRUCTURE; JOULE HEATING; PIEZORESISTIVITY; POSITIVE TEMPERATURE COEFFICIENT OF RESISTIVITY; SELF HEATING EFFECT;

BARIUM TITANATE;

EID: 0031192617     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.1997.tb03065.x     Document Type: Article

References (10)

1. M. Kuwabara, K. Morimo, and T. Matsunaga, "Single-Grain Boundaries in PTC Resistors," J. Am. Ceram. Soc., 79 [4] 997-1001 (1996).
2. 3 Ceramic Wire," unpublished work.
3. O. Saburi, "Piezoresistivity in Semiconductive Barium Titanates," J. Phys. Soc. Jpn., 15, 733-34 (1960).
4. H. A. Sauer, S. S. Flaschen, and D. C. Hoesterey, "Piezoresistance and Piezocapacitance Effects in Barium Titanate Ceramics," J. Am. Ceram. Soc., 42 [8] 363-66 (1959).
5. A. Amin, "Piezoresistivity in Semiconducting Positive Temperature Coefficient Ceramics," J. Am. Ceram. Soc., 72 [3] 369-76 (1989).
6. 3," J. Appl. Phys., 77 [10] 5322-34 (1995).
7. J. S. Capurso, A. B. Alles, and W. A. Schulze, "Processing of Laminated Barium Titanate Structures for Stress-Sensing Applications," J. Am. Ceram. Soc., 78 [9] 2476-80 (995).
8. E. Andrich, "PTC Thermistors as Self-Regulating Heating Elements," Philips Tech. Rev., 30 [6/7] 170-77 (1969).
9. B. Jaffe, W. R. Cook, Jr., and H. Jaffe, Piezoelectric Ceramics; Academic Press, London, U.K., 1971.
10. 3," Ferroelectrics, 2, 277-89 (1971).