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Volumn 241, Issue 1-2, 1997, Pages 192-198
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Microstructure and growth mechanism of Pt-Al2O3 co-sputtered nanocermet films studied by SAXS, TEM and AFM
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Author keywords
Atomic force microscopy; Cermet films; Growth; Low angle X ray scattering; Microstructure; Transmission electron microscopy
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Indexed keywords
ALUMINA;
ANNEALING;
ATOMIC FORCE MICROSCOPY;
COMPOSITION EFFECTS;
CRYSTAL MICROSTRUCTURE;
FILM GROWTH;
MORPHOLOGY;
NANOSTRUCTURED MATERIALS;
THERMAL EFFECTS;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY ANALYSIS;
LOW ANGLE X RAY SCATTERING;
CERMETS;
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EID: 0031192312
PISSN: 03784371
EISSN: None
Source Type: Journal
DOI: 10.1016/S0378-4371(97)00082-4 Document Type: Article |
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Times cited : (19)
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References (3)
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