Fault Diagnosis Based on Weighted Symptom Tree and Pattern Matching

Industrial and Engineering Chemistry Research

Volumn 36, Issue 7, 1997, Pages 2672-2678

  Oh, Young Seok ^a   Mo, Kyung Joo ^a   Yoon, En Sup ^a   Yoon, Jong Han ^b  

^a Seoul National University   (South Korea)

^b LG   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTER SIMULATION; TREES (MATHEMATICS);

FAULT PROPAGATION; PATTERN MATCHING ALGORITHM; TENNESSEE EASTMAN CHALLENGE PROCESS; WEIGHTED SYMPTOM TREE;

FAILURE ANALYSIS;

EID: 0031192302     PISSN: 08885885     EISSN: None     Source Type: Journal    
DOI: 10.1021/ie970009i     Document Type: Article

References (12)

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