Scanning probe microscopy studies of Ebonex® electrodes

Journal of Applied Electrochemistry

Volumn 27, Issue 7, 1997, Pages 815-820

  Smith, J R ^a   Nahle A H ^a,b   Walsh, F C ^a  

^a UNIVERSITY OF PORTSMOUTH   (United Kingdom)

^b AMERICAN UNIVERSITY OF BEIRUT   (Lebanon)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COPPER; NUCLEATION; POROUS MATERIALS; SCANNING TUNNELING MICROSCOPY; SURFACE STRUCTURE;

EBONEX ELECTRODES; SURFACE TOPOGRAPHY;

ELECTROCHEMICAL ELECTRODES;

EID: 0031191721     PISSN: 0021891X     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1018472828682     Document Type: Article

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