Benefits of scanning tunnelling microscopy for the study of martensitic transformation: The case of the γ(f.c.c.)↔ε(h.c.p.) transformation

Journal of Materials Science Letters

Volumn 16, Issue 13, 1997, Pages 1135-1138

  Bergeon, N ^a   Esnouf, C ^a   Guenin G ^a   Robach, Y ^b   Porte, L ^b  

^a UNIVERSITÉ DE LYON   (France)

^b ECOLE CENTRALE DE LYON   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COOLING; ELECTRON MICROSCOPY; LATTICE CONSTANTS; POLYCRYSTALLINE MATERIALS; SCANNING TUNNELING MICROSCOPY; SHEAR DEFORMATION; STACKING FAULTS; STRAIN; STRESS ANALYSIS; SURFACE STRUCTURE; THERMAL EFFECTS;

HIGH RESOLUTION ELECTRON MICROSCOPY (HREM); SURFACE TOPOGRAPHY;

MARTENSITIC TRANSFORMATIONS;

EID: 0031191234     PISSN: 02618028     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1018532204306     Document Type: Article

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