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Volumn 129, Issue 2, 1997, Pages 244-249

He+ beam induced damage of silicon carbide studied by vibrational spectroscopy

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; CRYSTALLINE MATERIALS; HELIUM; INFRARED SPECTROSCOPY; INTERFACES (MATERIALS); LATTICE VIBRATIONS; RADIATION DAMAGE; RAMAN SPECTROSCOPY; REFRACTIVE INDEX; THIN FILMS;

EID: 0031189795     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(97)00205-X     Document Type: Article
Times cited : (10)

References (7)
  • 3
    • 5844241724 scopus 로고
    • C.J. McHargue, J.M. Williams, Nucl. Instr. and Meth. B 80/81 (1993) 889; B 78 (1995) 1996.
    • (1995) Nucl. Instr. and Meth. B , vol.78 , pp. 1996
  • 6
    • 85033100492 scopus 로고    scopus 로고
    • E-mail : theiss@acds10.physik.rwth-aachen.de
    • W. Theiss, E-mail : theiss@acds10.physik.rwth-aachen.de.
    • Theiss, W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.