High-precision measurement of submicrometer particle size distributions

Langmuir

Volumn 13, Issue 15, 1997, Pages 3913-3914

  Wyatt, Philip J ^a   Villalpando, David N ^a  

^a Wyatt Technology Corporation   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; FRACTIONATION; LIGHT SCATTERING; PARTICLES (PARTICULATE MATTER);

SUBMICROMETER PARTICLES;

PARTICLE SIZE ANALYSIS;

EID: 0031189592     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la9703508     Document Type: Article

References (8)

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5. Shortt, D. W.; Roessner, D.; Wyatt, P. J. Am. Lab. 1996, 11, 21.
6. Caldwell, K. In Modern Methods of Particle Size Analysis; Barth, H. G., Ed.; John Wiley and Sons: New York, 1984; p 211.
7. Giddings, J. C. Science 1993, 260, 1456.
8. Wyatt, P. J. Anal. Chim. Acta 1993, 272, 1.