Cross-sectional observations by HRTEM of the structure of nickel oxide electrochromic thin films in the as-deposited state and the bleached state

Materials Research Bulletin

Volumn 32, Issue 7, 1997, Pages 839-845

  Yoshimura, Kazuki ^a   Miki, Takeshi ^a   Tanemura, Sakae ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

A. Oxides; A. Thin films; B. Sputtering; C. Electron microscopy; D. Electrochemical properties

Indexed keywords

ELECTROCHEMISTRY; ELECTROCHROMISM; MAGNETRON SPUTTERING; MICROSCOPIC EXAMINATION; OXIDES; SURFACE STRUCTURE; THIN FILMS;

ELECTROCHROMIC FILMS; NICKEL OXIDE;

NICKEL COMPOUNDS;

EID: 0031189582     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0025-5408(97)00057-3     Document Type: Article

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