FIM of vacancy clusters in the subsurface volume of the ion-implanted Pd(CuAg) alloy

Surface Science

Volumn 384, Issue 1-3, 1997, Pages 46-51

  Ivchenko, V A ^a   Ovchinnikov, V V ^a   Goloborodsky, B Yu ^a   Syutkin, N N ^a  

^a INSTITUTE OF ELECTROPHYSICS   (Russian Federation)

Author keywords

Field ion microscopy; Ion solid interactions; Palladium; Radiation damage; Surface defects

Indexed keywords

CURRENT DENSITY; ION BEAMS; ION IMPLANTATION; MICROSCOPIC EXAMINATION; PHASE TRANSITIONS; VOLUME FRACTION;

FIELD ION MICROSCOPY (FIM); ION SOLID INTERACTIONS; VACANCY CLUSTERS;

PALLADIUM ALLOYS;

EID: 0031189162     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(97)00142-8     Document Type: Article

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