A semiconducting A1N coating for microstrip gas chambers

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 394, Issue 1-2, 1997, Pages 265-267

  Bondar, A ^a   Buzulutskov, A ^a   Nagaslaev, V ^a   Shekhtman, L ^a   Tatarinov, A ^a   Blaut Blachev, A ^b   Bouilov, L ^b   Spitsyn, B ^b  

^a BUDKER INSTITUTE OF NUCLEAR PHYSICS   (Russian Federation)

^b Institute of Physical Chemistry Moscow   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

MICROSTRIP DEVICES; PERFORMANCE; PROPORTIONAL COUNTERS; SEMICONDUCTING ALUMINUM COMPOUNDS; THIN FILMS;

ALUMINUM NITRIDE FILMS;

SEMICONDUCTING FILMS;

EID: 0031188888     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(97)00646-3     Document Type: Article

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