Fast, automatic and accurate HFET small-signal characterization

Microwave Journal

Volumn 40, Issue 7, 1997, Pages

  Garcia, Mikael ^a   Yhland, Klas ^a   Zirath, Herbert ^a   Angelov, Ilcho ^a   Rorsman, Niklas ^a  

^a CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; COMPUTER AIDED DESIGN; DATA ACQUISITION; ELECTRIC CURRENT MEASUREMENT; ELECTRIC NETWORK ANALYSIS; EQUIVALENT CIRCUITS; MATHEMATICAL MODELS; SEMICONDUCTING GALLIUM ARSENIDE;

GATE DRAIN CAPACITANCE; GATE TO CHANNEL JUNCTION; HETEROSTRUCTURE FIELD EFFECT TRANSISTOR; THRESHOLD VOLTAGE; VECTOR NETWORK ANALYZER;

FIELD EFFECT TRANSISTORS;

EID: 0031188871     PISSN: 01926225     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (3)