XPS and PL studies of porous silicon treated in water and oxygen-rich gases

Physica A: Statistical Mechanics and its Applications

Volumn 241, Issue 1-2, 1997, Pages 398-402

  Kobeleva, S P ^a   Sergeeva, T G ^a   Leiferov, B M ^a   Ivanova, A L ^a  

^a INSTITUTE OF RARE METALS   (Russian Federation)

Author keywords

Photoluminescence; Porous silicon; Silicon oxide; X ray photoelectron spectroscopy

Indexed keywords

CRYSTAL STRUCTURE; OXYGEN; PHOTOLUMINESCENCE; SILICA; X RAY PHOTOELECTRON SPECTROSCOPY;

ANODIZED SAMPLES;

POROUS SILICON;

EID: 0031188472     PISSN: 03784371     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0378-4371(97)00114-3     Document Type: Article

References (3)

1. L.A. Balagurov, N.B. Smirnov, E.A. Kozhukhova, A.F. Orlov, E.A. Petrova, A.Ya. Polyakov, RAS Phys. 58 (1994) 1132.
2. L.A. Balagurov, B.M. Leiferov, E.A. Petrova, A.F. Orlov and E.M. Panasenko, J. Appl. Phys. 79 (1996) 6233.
3. D. Briggs and M.P. Seach, Practical Surface Analyses by Auger and X-ray Photoelectron Spectroscopy (Wiley, London, 1983).