Spatially resolved detection of mutually locked Josephson junctions in arrays

Applied Physics Letters

Volumn 71, Issue 2, 1997, Pages 270-272

  Keck, M ^a   Doderer, T ^a   Huebener, R P ^a   Traeuble, T ^b   Dolata, R ^b   Weimann, T ^b   Niemeyer, J ^b  

^a UNIVERSITY OF TÜBINGEN   (Germany)

^b PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CRITICAL CURRENTS; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC RESISTANCE; ELECTRON BEAMS; RESISTORS; SCANNING ELECTRON MICROSCOPY; SQUIDS;

LOW TEMPERATURE SCANNING ELECTRON MICROSCOPY; PHASE LOCKING; TWO DIMENSIONAL ARRAY;

JOSEPHSON JUNCTION DEVICES;

EID: 0031188368     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.119516     Document Type: Article

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