Automated diagnosis in testing and failure analysis

IEEE Design and Test of Computers

Volumn 14, Issue 3, 1997, Pages 83-89

  Butler, Kenneth M ^a,b,c,d,e,f   Johnson, Karl ^a,e,g,h   Platt, Jeff ^a,i,j,k   Kinra, Anjali ^a,e,k,l,m   Saxena, Jayashree ^a,e,n  

^a TEXAS INSTRUMENTS   (United States)

^b TI's Semiconductor Group   (United States)

^c OKLAHOMA STATE UNIVERSITY   (United States)

^d UNIVERSITY OF TEXAS AT AUSTIN   (United States)

^e IEEE   (United States)

^f IEEE ^*  (United States)

^g CADENCE DESIGN SYSTEMS   (United States)

^h UNIVERSITY OF CINCINNATI   (United States)

ⁱ DMOS V Product Engineering

^j DMOS V Product Engineering ^*  (United States)

^k TEXAS A AND M UNIVERSITY   (United States)

^l ACP Sparc Department

^m IBM   (United States)

ⁿ University of Massachusetts   (United States)

more..

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATED DIAGNOSIS (AD); FOCUSED ION BEAM (FIB) MACHINE; MULTIMEDIA VIDEO PROCESSOR (MVP);

AUTOMATION; COMPUTER ARCHITECTURE; COMPUTER DEBUGGING; COMPUTER SOFTWARE; ERROR CORRECTION; FAILURE ANALYSIS; INTEGRATED CIRCUIT LAYOUT; SCANNING ELECTRON MICROSCOPY;

INTEGRATED CIRCUIT TESTING;

EID: 0031187671     PISSN: 07407475     EISSN: None     Source Type: Journal    
DOI: 10.1109/54.606003     Document Type: Article

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