Test generation for multiple state-table faults in finite-State machines

IEEE Transactions on Computers

Volumn 46, Issue 7, 1997, Pages 783-794

  Pomeranz, Irith ^a,b   Reddy, Sudhakar M ^a,b  

^a IEEE   (United States)

^b UNIVERSITY OF IOWA   (United States)

Author keywords

Finite state machines; Implicit enumeration; Multiple faults; State table faults; Test generation

Indexed keywords

ERROR CORRECTION; FAULT TOLERANT COMPUTER SYSTEMS;

FINITE STATE MACHINES; STATE TABLE FAULTS;

SEQUENTIAL MACHINES;

EID: 0031187170     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/12.599899     Document Type: Article

References (8)

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