Reliability characterization of mixed-signal chip

IEEE Circuits and Devices Magazine

Volumn 13, Issue 4, 1997, Pages 8-10

  Abel, Christopher ^a   Michael, Christopher ^b   Ismail, Mohammed ^c   Teng, C S ^b   Lahri, Rajeeva ^b  

^a NOKIA RESEARCH CENTER   (United States)

^b NATIONAL SEMICONDUCTOR CORPORATION   (United States)

^c Ohio State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FEEDBACK AMPLIFIERS; INTEGRATED CIRCUIT TESTING; MOS DEVICES; OPERATIONAL AMPLIFIERS;

LOAD SWITCHING NETWORK; MISMATCH DRIFT; MIXED SIGNAL CHIPS;

CMOS INTEGRATED CIRCUITS;

EID: 0031186823     PISSN: 87553996     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (4)

1. C. Michael, H. Wang, C.S. Teng, J. Shibley, L. Lewicki, C. Shyu, and R. Lahri, "Mismatch drift: A reliability issue for analog MOS circuits," Processings of 1992 IRPS, pp. 81-84, 1992
2. Paul R. Gray and Robert G. Meyer, Analysis and Design of Analog Integrated Circuits, John Wiley and Sons, 1984
3. L. Lewicki, J. Wieser, C. Phan, Private Conversation, July 7, 1992.
4. M.J.M. Pelgrom, A.C.J. Duinmaiger, and A.P.G. Welburs, "Matching properties of MOS transistors for precision analog design," IEEE Journal of Solid-State Circuits, vol. SC-24, pp.1433-1439, October 1989.