Study on failure mechanisms of GTO forward blocking junction during turn-off process

Zhongguo Dianji Gongcheng Xuebao/Proceedings of the Chinese Society of Electrical Engineering

Volumn 17, Issue 4, 1997, Pages 259-263,-277

  Zhang, Li ^a   Liu, Lixian ^a   Chen, Zhimin ^a   Zheng, Tongjiang ^a   Ji, Lingyun ^a   Zhang, ChangLi ^a   Bai, Jie ^a   Gao, Zhancheng ^a  

^a TIANJIN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ANODES; CHARGE CARRIERS; ELECTRIC FAULT CURRENTS; ELECTRIC FAULT LOCATION; FAILURE ANALYSIS; MATHEMATICAL MODELS; SEMICONDUCTOR JUNCTIONS; TRANSIENTS;

ANODE SPIKE VOLTAGE; FORWARD BLOCKING JUNCTION; GTO FAILURE;

THYRISTORS;

EID: 0031186414     PISSN: 02588013     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (6)