Diagnosing IC Failures in a Fast Environment

IEEE Design and Test of Computers

Volumn 14, Issue 3, 1997, Pages 70-75

  Staab, Donald ^a   Hnatek, Eugene R ^a  

^a HEWLETT PACKARD COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED DESIGN; CONCURRENT ENGINEERING; COST EFFECTIVENESS; DATABASE SYSTEMS; FAILURE ANALYSIS; INTEGRATED CIRCUIT LAYOUT; PROBLEM SOLVING; RELIABILITY;

PROACTIVE FAILURE ANALYSIS;

INTEGRATED CIRCUIT TESTING;

EID: 0031186307     PISSN: 07407475     EISSN: None     Source Type: Journal    
DOI: 10.1109/54.606000     Document Type: Article

References (10)

1. Aitken, R., “A Comparison of Defect Models for Fault Location with IDDQ Measurement,” Proc. Int'l Test Conf., IEEE Computer Society Press, Los Alamitos, Calif., 1992, pp. 778-787.
2. Chakravarty, S., and P. Thadikaran, “A Study of IDDQSubset Selection Algorithms for Bridging Faults,” Proc. Int'l Test Conf., 1994, pp. 403-412.
3. Gayle, R., “The Cost of Quality: Reducing ASIC Defects with IDDQ,AtSpeed Testing, and Increased Fault Coverage,” Proc. Int'l Test Conf., 1993, pp. 285-292.
4. Hawkins, C.F., et al., “Defect Classes: An Overdue Paradigm for CMOS IC Testing,” Proc. Int'l Test Conf., 1994, pp. 413-425.
5. Kunda, R.P., “Fault Location in Full-Scan Designs,” Proc. 19th Int'l Symp. Testing and Failure Analysis, ASM Int'l, Materials Park, Oh., 1993, pp. 121-127.
6. Maxwell, P., et al., “The Effectiveness of IDDQ, Functional, and Scan Tests: How Many Fault Coverages Do We Need?,” Proc. Int'l Test Conf., 1992, pp. 168-177.
7. Perry, R., “IDDQTesting in CMOS Digital ASICs: Putting It All Together,” Proc. Int'l Test Conf., 1992, pp. 151-157.
8. Rearick, J., and J. Patel, “Fast and Accurate CMOS Bridging Fault Simulation,” Proc. Int'l Test Conf., 1993, pp. 54-62.
9. Ryan, P., K. Davis, and S. Rawat, “A Case Study of Two-Stage Fault Location,” Proc. Int'l Reliability Physics Symp., IEEE, Piscataway, N.J., 1992, pp. 332-337.
10. Ryan, P.G., and W.K. Fuchs, “Addressing the Size Problem in Fault Dictionaries,” Proc. 19th Int'l Symp. Testing and Failure Analysis, 1993, pp. 129-133.