Crystal growth and structural characterization of new piezoelectric material La3Ta0.5Ga5.5O14

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 36, Issue 7 B, 1997, Pages

  Takeda, Hiroaki ^a   Sugiyama, Kazumasa ^a   Inaba, Katsuhiko ^a   Shimamura, Kiyoshi ^a   Fukuda, Tsuguo ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; CRYSTAL GROWTH; CRYSTAL STRUCTURE; PIEZOELECTRIC MATERIALS; SINGLE CRYSTALS; X RAY CRYSTALLOGRAPHY;

CZOCHRALSKI TECHNIQUE; LANTHANUM TANTALUM GALLIUM OXIDE;

LANTHANUM COMPOUNDS;

EID: 0031186046     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.36.l919     Document Type: Article

References (19)