Characterization of the ion-plated TiN on AISI 304 stainless steel by energy filtering transmission electron microscopy

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 15, Issue 4, 1997, Pages 2318-2322

  Shieu, F S ^a   Cheng, L H ^a   Sung, Y C ^b   Huang, J H ^b   Yu, G P ^b  

^a NATIONAL CHUNG HSING UNIVERSITY   (Taiwan)

^b NATIONAL TSING HUA UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL ANALYSIS; COMPOSITION; ELECTRON ENERGY LOSS SPECTROSCOPY; GRAIN SIZE AND SHAPE; INTERFACES (MATERIALS); ION BEAMS; ION BOMBARDMENT; MICROSTRUCTURE; PLATING; PROTECTIVE COATINGS; STAINLESS STEEL; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRON SPECTROSCOPIC IMAGING; ENERGY FILTERING TRANSMISSION ELECTRON MICROSCOPY; HOLLOW CATHODE DISCHARGE; SELECTED AREA DIFFRACTION;

TITANIUM NITRIDE;

EID: 0031186016     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.580741     Document Type: Article

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