Hot-carrier degradation mechanisms in silicon-on-insulator MOSFETs

Microelectronics Reliability

Volumn 37, Issue 7 SPEC. ISS., 1997, Pages 1003-1013

  Cristoloveanu, Sorin ^a  

^a Lab Phys Composants S   (France)

Author keywords

[No Author keywords available]

Indexed keywords

AGING OF MATERIALS; DEGRADATION; GATES (TRANSISTOR); HOT CARRIERS; SEMICONDUCTING FILMS; SILICON ON INSULATOR TECHNOLOGY;

BURIED OXIDES;

MOSFET DEVICES;

EID: 0031185774     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0026-2714(96)00262-4     Document Type: Article

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